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Hardware-in-the-loop ( HIL) simulation, or HWIL, is a technique that is used in the development and testing of complex real-time embedded systems. HIL simulation provides an effective testing platform by adding the complexity of the process-actuator system, known as a plant, to the test platform. The complexity of the plant under control is ...
Automatic test equipment or automated test equipment ( ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex ...
A built-in self-test ( BIST) or built-in test ( BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as: or constraints such as: The main purpose [1] of BIST is to reduce the complexity, and thereby decrease the cost and reduce reliance upon external (pattern-programmed) test equipment.
Power-on self-test. A power-on self-test ( POST) is a process performed by firmware or software routines immediately after a computer or other digital electronic device is powered on. [1] POST processes may set the initial state of the device from firmware and detect if any hardware components are non-functional.
In-circuit testing ( ICT) is an example of white box testing where an electrical probe tests a populated printed circuit board (PCB), checking for shorts, opens, resistance, capacitance, and other basic quantities which will show whether the assembly was correctly fabricated. [1] It may be performed with a "bed of nails" test fixture and specialist test equipment, or with a fixtureless in ...
The Windows Hardware Lab Kit ( Windows HLK) is a test automation framework provided by Microsoft to certify devices for Windows. Earlier similarly released frameworks were called Windows Hardware Certification Kit (Windows HCK) and Windows Logo Kit (WLK).
Logic built-in self-test (or LBIST) is a form of built-in self-test (BIST) in which hardware and/or software is built into integrated circuits allowing them to test their own operation, as opposed to reliance on external automated test equipment .
Hardware stress test A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity, often to a breaking point, in order to observe the results.
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