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The Gajski–Kuhn chart (or Y diagram) depicts the different perspectives in VLSI hardware design. [1] Mostly, it is used for the development of integrated circuits. Daniel Gajski and Robert Kuhn developed it in 1983. In 1985, Robert Walker and Donald Thomas refined it. According to this model, the development of hardware is perceived within ...
Very-large-scale integration. Very-large-scale integration ( VLSI) is the process of creating an integrated circuit (IC) by combining millions or billions of MOS transistors onto a single chip. VLSI began in the 1970s when MOS integrated circuit (Metal Oxide Semiconductor) chips were developed and then widely adopted, enabling complex ...
In December 2009, a technical subcommittee of Accellera — a standards organization in the electronic design automation (EDA) industry — voted to establish the UVM and decided to base this new standard on the Open Verification Methodology (OVM-2.1.1), [1] a verification methodology developed jointly in 2007 by Cadence Design Systems and Mentor Graphics.
In integrated circuit design, physical design is a step in the standard design cycle which follows after the circuit design.At this step, circuit representations of the components (devices and interconnects) of the design are converted into geometric representations of shapes which, when manufactured in the corresponding layers of materials, will ensure the required functioning of the components.
The Mead–Conway VLSI chip design revolution, or Mead and Conway revolution, was a very-large-scale integration design revolution starting in 1978 which resulted in a worldwide restructuring of academic materials in computer science and electrical engineering education, and was paramount for the development of industries based on the application of microelectronics.
Physical verification is a process whereby an integrated circuit layout (IC layout) design is verified via EDA software tools to ensure correct electrical and logical functionality and manufacturability. Verification involves design rule check (DRC), layout versus schematic (LVS), XOR (exclusive OR), antenna checks and electrical rule check (ERC).
The codes given in the chart below usually tell the length and width of the components in tenths of millimeters or hundredths of inches. For example, a metric 2520 component is 2.5 mm by 2.0 mm which corresponds roughly to 0.10 inches by 0.08 inches (hence, imperial size is 1008).
Standard Parasitic Exchange Format ( SPEF) is an IEEE standard for representing parasitic data of wires in a chip in ASCII format. Non-ideal wires have parasitic resistance and capacitance that are captured by SPEF. These wires also have inductance that is not included in SPEF. SPEF is used for delay calculation and ensuring signal integrity of ...